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| Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits
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| ZHANG Min-Xuan, SUN Yan, SONG Chao |
| (College of Computer, National University of Defense Technology, Changsha 410073, China) |
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Abstract This paper described the mechanism, trends and evaluation techniques of soft errors in nanometer scale integrated circuits. For solving the soft error problems, the paper summed up the countermeasures across the software level, circuit and architecturelevel as well as process devicelevel. At last, some suggestions on the development of related studies on soft error problems were put
forward.
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Received: 30 May 2012
Published: 30 January 2013
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