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Abstract Considering the difficulty of measuring cross-plane thermal diffusivity of thin films, a new method of measuring the cross-plane thermal diffusivity of thin films was approached by combining the apparatus of steady-state comparative-longitudinal heat flow (SCHF) method and the one-dimensional thermal wave in Angstr-m method. The propagation of thermal wave was analyzed and the cross-plane thermal diffusivity of thin films was deduced. By this method, three types of thin films samples (PTFE, polyvinylchloride and polypropylene) with various thicknesses ranging from 30 μm-1 mm were tested and this method is reliable.
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Received: 05 September 2011
Published: 30 July 2012
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