Abstract：In order to improve the quality of products and process design, this paper mainly aims to eliminate the failure rate of initial products, improve their mean time between failures and further save product costs. Based on the theoretical requirements of HASS profile design, the paper presents the general screening profile conditions for electronic product HASS screening through specific failure analysis and test profile design optimization, which could be used as a reference for the HASS of electronic products and improve the screening test efficiency.
诸戈, 汤杰, 漆斌, 郭森, 姚永超. 基于高加速应力筛选的电子产品筛选剖面研究[J]. 空天防御, 2023, 6(1): 17-22.
ZHU Ge, TANG Jie, QI Bin, GUO Sen, YAO Yongchao. Research on Screening Profile of Electronic Devices Based on Highly Accelerated Stress Screening. Air & Space Defense, 2023, 6(1): 17-22.
