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空天防御  2025, Vol. 8 Issue (2): 103-111    
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寄生参数对SiC MOSFET开关特性的影响分析及建模
于泓, 刘宜罡, 李颖, 乔金鑫, 简方恒
上海机电工程研究所,上海 201109
Analysis and Modeling of the Impact of Parasitic Parameters on SiC MOSFET Switching Characteristics
YU Hong, LIU Yigang, LI Ying, QIAO Jinxin, JIAN Fangheng
Shanghai Electro-Mechanical Engineering Institute, Shanghai 201109, China
全文: PDF(4085 KB)  
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摘要 为了探究功率驱动电路中寄生参数对SiC MOSFET高速开关特性的影响,对SiC MOSFET的材料特性及其开关瞬态行为中的动态特性进行系统研究。重点分析各种寄生元件参数对其开关过程的影响,建立SiC MOSFET在导通和关断过程的理论模型,开发双脉冲仿真平台;构建与实物参数一致的虚拟仿真环境,通过仿真和试验两种方法获取SiC MOSFET在不同栅源极电容和栅极电阻下的测试曲线。将仿真结果和试验结果进行对比,验证了栅源极电容和栅极电阻对SiC MOSFET开关瞬态行为的影响,同时也检验了本文仿真模型的准确性和精度。
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关键词 功率驱动电路电力电子碳化硅(SiC MOSFET)寄生参数双脉冲试验    
Abstract:To explore the effects of parasitic parameters in the power driving circuit on the SiC MOSFET high-speed switch characteristics, this paper systematically studied the material properties of SiC MOSFET and the dynamic characteristics in the transient behaviour of switching. The influence of various parasitic element parameters on the switching process was analysed. The theoretical model of SiC MOSFET in the turn-on and turn-off process was established, and a double-pulse simulation platform was developed. A virtual simulation environment consistent with the physical parameters was constructed, and the test curves of SiC MOSFET under different gate-source capacitances and gate resistance were acquired through simulation and experiment. Finally, the simulation results were compared with the test results, where the effects of gate resistance and gate-source capacitance parameters on SiC MOSFET switch characteristics were verified. In the meantime, the accuracy and precision of the simulation model were also checked.
Key wordspower driving circuit    power electronics    SiC MOSFET    parasitic parameters    double pulse experimental
收稿日期: 2024-10-21      出版日期: 2025-05-23
ZTFLH:  TM 921  
基金资助:航天科技集团应用创新计划项目(6XX0109003)
作者简介: 于泓(1997—),男,硕士,工程师。
引用本文:   
于泓, 刘宜罡, 李颖, 乔金鑫, 简方恒. 寄生参数对SiC MOSFET开关特性的影响分析及建模[J]. 空天防御, 2025, 8(2): 103-111.
YU Hong, LIU Yigang, LI Ying, QIAO Jinxin, JIAN Fangheng. Analysis and Modeling of the Impact of Parasitic Parameters on SiC MOSFET Switching Characteristics. Air & Space Defense, 2025, 8(2): 103-111.
链接本文:  
https://www.qk.sjtu.edu.cn/ktfy/CN/      或      https://www.qk.sjtu.edu.cn/ktfy/CN/Y2025/V8/I2/103

参考文献
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