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Research and Exploration in Laboratory  2017, Vol. 36 Issue (5): 68-71    DOI:
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A Testing System of Commonly Used Digital Crcuitchip
Yan LIU(), Xi GAO, Bin ZHANG, Hao JING, Haixian TANG
College of Internet of Things Engineering, Hohai University, Changzhou 213022, Jiangsu, China
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