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Abstract In order to improve the quality of products and process design, this paper mainly aims to eliminate the failure rate of initial products, improve their mean time between failures and further save product costs. Based on the theoretical requirements of HASS profile design, the paper presents the general screening profile conditions for electronic product HASS screening through specific failure analysis and test profile design optimization, which could be used as a reference for the HASS of electronic products and improve the screening test efficiency.
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Received: 07 December 2022
Published: 30 March 2023
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2023, Vol. 6 
