Fig. 2 depicts the critical current with respect to (Ba + dopant)/Cu ratio at orientations B⊥tape (4.2 K, 13 T and 20 K, 13 T) of the best-performing 5 mol.% Hf, 5 mol.% Zr, 15 mol.% Hf, and 15 mol.% Zr short samples with a thickness > 5 µm, fabricated in the R&D A-MOCVD tool. The
Ic at 4.2 K and 20 K in a magnetic field of 13 T was calculated by multiplying the lift factor value with the transport
Ic at 77 K, self-field. Lift factor is the ratio of
Ic at 4.2 or 20 K, 13 T (B⊥tape) to
Ic at 77 K, 0 T, measured using VSM. It is seen in
Fig. 2 that regardless of the type of dopant or its concentration, at the optimum (Ba + dopant)/Cu value, the peak
Ic of the thick film REBCO is >6000 A/12 mm at 4.2 K and 13 T. The peak
Ic is >3,000 A/12 mm for all categories of samples at 20 K and 13 T. The corresponding (Ba + dopant)/Cu ratios for the peak-
Ic REBCO samples are 0.67, 0.72, 0.76, and 0.78 for 5 mol.% Hf, 5 mol.% Zr, 15 mol.% Hf, and 15 mol.% Zr, respectively. The findings indicate that for the highest in-field
Ic at 4.2 K and 20 K, the Hf-doped REBCO film requires less Ba content than the Zr-doped sample and that samples with a higher dopant content require higher Ba content. These results demonstrate the important role of Ba content in the REBCO film deposited using A-MOCVD for use in high-field applications at 4.2 K and 20 K. 5% Zr content was used for long tapes fabricated in this work.