1. Introduction
Fig. 1. Illustration of screening currents in a solenoid wound with REBCO coated conductors, and the enlarged view showing the current distribution and conductor deformation. |
2. Design, construction, and experimental setup
Table 1. Parameters of the insert coil. |
| Parameter | Unit | Value |
|---|---|---|
| conductor width; thickness | [mm] | 4; 0.1 |
| inner diameter; outer diameter | [mm] | 14; 34 |
| number of single pancakes | 12 | |
| average turns per pancake | 100 | |
| total height | [mm] | 52 |
| total conductor length | [m] | 90 |
| magnetic coefficient at coil center | [mT/A] | 26.2 |
Fig. 2. Coil tests in liquid nitrogen at 77 K: (a) critical current, power-law index and joint resistance of each double pancake; (b) charging of the coil assembly coil up to 20 A. |
2.1. Self-field experiment setup in LHe
Fig. 3. Self-field experimental setup: (a) positions of the Hall sensors H1 and H2, relative to the superconductor winding (not to scale); (b) profile of the applied current, where the polarity is reversed in turn, reaching peak currents of 105 A, 250 A, and 350 A. |
2.2. Experiment setup in a background field
3. Electromagnetic-mechanical model
Fig. 4. (a) Geometry of the electromagnetic model, where the single pancakes are labeled PA to PF from top to middle. (b) Boundary conditions in the mechanical analysis, where v is the axial displacement. Omitting the pancake-to-spacer contacts, constraints on the axial displacement are defined in each pancake and imposed on the lower right corner of the conductor. |
4. Results
4.1. Self-field Experiment
Fig. 5. Total magnetic fields measured with Hall sensors H1 (left) and H2 (right). The arrows show the direction of the initial charging sequence, and the solid lines are the nominal field. The total magnetic field deviates from the nominal field with typical hysteresis behaviors. |
4.2. Charging behaviors in a background field
Fig. 6. Applied current, center field, coil voltage, and temperature during the experiment in the background field. The total center field reached 32.58 T prior to quench, with 4.17 T contributed by the REBCO insert. |
5. Discussions
5.1. Screening-current-induced magnetic field
5.1.1. Self-field hysteresis
Fig. 7. Self-field screening-current-induced magnetic fields obtained by Hall sensors H1 (left) and H2 (right). Results from the coupled model and the sequential model are represented by the solid lines and the dashed lines, respectively. |
Fig. 8. Current distributions with an applied current of 350 A, obtained from (a) the sequential model and (b) the coupled model. (c) A close-up comparison of the current density profiles of the 10th turns in the top pancake and the middle pancake. |
Fig. 9. Calculated screening-current-induced magnetic fields at the coil center. Using the sequential model and the coupled model, the total field intensity is estimated to decrease by 0.60 T and 0.62 T, respectively, at the peak current of 350 A. |
5.1.2. Field deviation in a background field
Fig. 10. Measured and calculated screening-current-induced magnetic field at the coil center in a background field of 23.15 T. The enlarged view shows the transient behaviors of the magnetic field corresponding to the relaxation of the bypass current. |
Fig. 11. Current distributions with an applied current of 170 A in a background field, calculated by (a) the sequential model and (b) the coupled model. (c) A close-up comparison of the current density profiles of the 90th turns in the top pancake and the middle pancake. |
5.2. Screening-current-induced strains
5.2.1. Self-field at peak current 350 A
Fig. 12. Hoop strain distributions with the peak current of 350 A, calculated by (a) the sequential model and (b) the coupled model. (c) Comparison of the ranges of hoop strains in pancake PA and PD. |
5.2.2. In-field condition at 170 A
Fig. 13. Hoop strain distributions with the peak current of 170 A in a 23.15-T background field, calculated by (a) the sequential model and (b) the coupled model. (c) Comparison of the ranges of hoop strains in pancake PA and PF. |
5.3. Field contribution by insert and outsert
Fig. 14. Maximum hoop strains when inserted in background fields from 12 T to 30 T and percentage of conductor in the each pancake with hoop strains over 0.5%. The plots are aligned by the center field contribution from the insert. |
Fig. 15. Contour plot of the maximum hoop strain by background field provided by the outsert and applied current in the insert, with dashed lines denoting the total center field. |

