1. Introduction
Table 1. Measurement methods for coil constants of HTS NI coils. |
| Methods | Coil types | Impactors on measurement accuracy | Measurement Speed |
|---|---|---|---|
| Simulation [17] | All NI coils | Resolution, relative position, operating temperature, and calibration of the Hall sensors, as well as SCIF | Fast |
| Conventional method [24], [25], [26] | All NI coils | SCIF | Slow, decided by the charging delay |
| Proposed method | NI closed-loop coils | SCIF (but can be ignored when directly measuring the operational current) | Moderate |
2. Methods
2.1. Proposed measurement method
Fig. 1. Circuit topology of the proposed method. |
Fig. 2. Flowchart of proposed method for operational current of HTS NI closed-loop coil. |
Table 2. Definitions and determining principles of proposed method. |
| Variables | Definitions | Determining principles | Values for tested coils |
|---|---|---|---|
| B | Real-time magnetic field | / | / |
| $I_{power}$ | Output current of power supply | / | / |
| $U_{coil}$ | Real-time coil voltage | / | / |
| $I_{op}$ | Operational current | / | / |
| $B_0$ | Initial value of magnetic field | Coil is in steady PCM | / |
| $I_{power}$,0 | Initial output current of power supply | Estimating by dividing B0 with ideal Cc | / |
| τ | Time constant of coil in steady PCM | L/Rj,L is coil inductance and Rj is joints resistance | ∼9.42×106 s for Coil B |
| $U_c$ | Criterion of $U_{coil}$ | k×AmRtRPCS/(Rt+RPCS),Rt is total turn-to-turn resistance and RPCS is PCS resistance | 0.005 mV for Coil A, 0.021 mV for Coil B |
| $A_m$ | Current accuracy of measurement | Equalling output resolution of power supply | 0.1 A |
| k | Safety coefficient | / | 0.3 |
2.2. Numerical description
Fig. 3. Topology of equivalent circuit model of HTS NI closed-loop coil. |
3. Demonstration test
3.1. Experimental settings
Table 3. Experimental specifications. |
| Items of conductor | Parameters or details |
|---|---|
| Type | BHO-doped REBCO tape, Shanghai Superconductor Technology Co. Ltd |
| Width and thickness | 6 and ∼0.19 mm |
| Items of Coil A (single-pancake) | Parameters or details |
| Number of turns | 360 turns |
| Inner and outer radius | 35 and 102 mm |
| Inductance | 17.5 mH |
| Conductor length in PCS | ∼10 cm |
| PCS resistance when heated, $R_{PCS}$ | 0.4 mΩ |
| Total turn-to-turn resistance, $R_t$ | 336 μΩ |
| Hall sensor | HT90150 (QD Honor Top Magnetic Technology Co. Ltd.) |
| Items of Coil B (double-pancake) | Parameters or details |
| Number of turns | 460 turns per pancake coil |
| Length of linear edge | 140 mm |
| Inner diameter of arc edge | 180 mm |
| Inductance | 393.5 mH |
| Joints resistance | ∼41.4 nΩ |
| Number of repeatable circuit elements | 18 |
| Inner diameter of PCS | 50 mm |
| Turns of PCS | 80 |
| PCS resistance when heated, $R_{PCS}$S | 11 mΩ |
| Total turn-to-turn resistance, $R_t$ | 744 μΩ |
| Hall sensors | HGCA-3020 (Lake Shore Cryotronics Inc.) and HT90150 |
Fig. 4. Schematic of experimental setup: (a) apparatus; (b) dimensional drawing of Coil A; dimensional drawings of Coil B in (c) front view and (d) lateral view. |
Fig. 5. Variation of PCS resistance of Coil B for simulations. |
3.2. Demonstration test for coil A
Fig. 6. Output current of power supply and coil voltage during demonstration test for Coil A, with boundary of voltage criterion denoted by $U_c$ (dashed lines). |
3.3. Demonstration test for coil B
Fig. 7. Output current of power supply and coil voltage during demonstration test for Coil B, with boundary of voltage criterion denoted by $U_c$ (dashed lines). |
4. Discussion
4.1. Accuracy of proposed method
Fig. 8. Simulated results of coil voltages in cases of setting $I_{op,0}$ as 22.00 and 22.20 A, compared to the experimental data (denoted as “Exp”). |
Table 4. Results and errors of operational current in five virtual measurement cases. |
| $I_{op,0}$ | Measured $I_{op}$ | Error |
|---|---|---|
| 22.00 A | 22.1 A | 0.1 A |
| 22.05 A | 22.1 A | 0.05 A |
| 22.10 A | 22.1 A | 0 A |
| 22.15 A | 22.2 A | 0.05 A |
| 22.20 A | 22.2 A | 0 A |
Table 5. Comparison of measured results of Coil B by simulation and proposed method. |
| Method | Measured $B_0$ | Measured $C_c$ |
|---|---|---|
| Simulation | 89.741 mT | 4.061 mT/A |
| Proposed method | 100.311 mT (using sensor HT90150) | 4.539 mT/A |
| Proposed method | 91.239 mT (using sensor HGCA-3020) | 4.128 mT/A |
4.2. Speed of proposed method
Fig. 9. Magnetic field and its difference to $B_{ideal}$ of EDS magnet during virtual measurement when using the conventional method. |
Fig. 10. Output current of power supply and coil voltage of EDS magnet during virtual measurement when using proposed method. |
4.3. Impact form SCIF
Fig. 11. Simulated and experimental results of coil constant of Coil A, as well as ideal coil constant (solid line). |
4.4. Measurement error if the coil is not in the steady PCM
Fig. 12. Variations of currents and magnetic field of Coil B in charging and subsequent transient processes. |
Fig. 13. Results of virtual measurement of Coil B, when coil was not in steady PCM. |
Table 6. Measured results of operational current of Coil B during transient process. |
| Initiated moment | Measured $I_{op}$ | Error compared to result in demonstration test |
|---|---|---|
| 1400 s | 22.9 A | 0.8 A |
| 1500 s | 22.5 A | 0.4 A |
| 1600 s | 22.4 A | 0.3 A |
| 1700 s | 22.3 A | 0.2 A |
| 1800 s | 22.2 A | 0.1 A |
| 2000 s | 22.2 A | 0.1 A |
| 2300 s | 22.2 A | 0.1 A |
Fig. 14. Variations of normalized magnetic field and maximum difference of azimuthal currents during transient process. |
Fig. 15. Variations of normalized magnetic fields in the transient process and steady PCM in simulated cases of charging coil with $I_{power,max }$ equaling 10, 30, and 50 A. |

