Vortices interact with a pinning center either through the spatial variation in Tc (between superconducting matrix and non-superconducting/insulating pinning center) or the spatial variations in the charge carriers’ mean free path,
l near the lattice defects. Both these interactions result in the spatial variation of the GL order parameter and the pinning resulting from these interactions are termed as "
$\delta T_{c}$" and "δl" pinning respectively. Following Blatter
et al. [
5] and Griessen
et al. [
49],
$J_c$ is a function of reduced temperature
t (=T/T
c) and in the single vortex pinning regime, it follows the relation
$J_{c}(t) \propto\left[1-\left(T / T_{c}\right)^{2}\right]^{n}$[
50]. The value of the characteristic exponent
‘n’ determines the dominant vortex pinning mechanism in the superconducting sample.
n = 1.2 is ascribed to
$\delta T_{c}$ pinning while
n = 2.5 refers to δl pinning. As mentioned before,
$\delta T_{c}$ pinning is expected for nanoparticle dominated pinning landscape and δl pinning is expected for a pinning landscape completely dominated by point defects.
Fig. 8 shows the log–log plot of
$J_c$ vs.
$1-\left(T / T_{c}\right)^{2}$ for YBCO+Y211 nanocomposite films at an applied magnetic field of 1 T. The values of
n, as extracted from these plots, are 1.99, 1.72, 2.41 and 2.05 for YBCO, YBCO+Y211A, YBCO+Y211B and YBCO+Y211C films respectively. In one of the earlier reports on YGdBCO films consisting of BZO nanoparticles, the value of the exponent
n (=1.24) was found to be closer to the theoretical value of 1.2 indicative of δTc pinning [
51]. This value is much different than that for YBCO+Y211 films being investigated in this paper. There are two principal differences that can be considered for such a variation in the
n value in these two studies: (i) The median size of the BZO nanoparticles in the YGdBCO films is much larger (∼23 nm) than that for Y211 nanoparticles (∼5–7 nm) in YBCO+Y211 films being studied in this paper. In the previous report, a fair amount of Y225 nanoparticles were also observed which were even larger in size (∼80 nm). (ii) The growth process of PLD and MOD are very different which result in very different interfaces between the host matrix and the secondary phases. In a recent report, high resolution plan-view TEM images and geometrical phase analysis were employed to reveal the strain induced by secondary phase nanoinclusions in the PLD and MOD grown films [
52]. The strain component maps reveal that in PLD grown films, the compressive and tensile stains are localized near the matrix/APC coherent interfaces and spread over a distance of ∼10 nm whereas, for MOD grown thin films, the strain is localized over far shorter distance (∼2 nm) around the incoherent matrix/APC interfaces. The range of lattice deformation, therefore, is much different in films grown by PLD and MOD techniques. Since, these local lattice deformations are the main sources of δl pinning, the PLD and MOD grown films are expected to exhibit different values of the characteristic exponent
‘n’ indicative of the type of pinning prevalent in the films. As the pinning landscape in YBCO+Y211 thin films being investigated in this paper is complex consisting of the Y211 nanoinclusions, dislocations along the
ab-plane, and weak point pinning centers as well, the precise
n values as predicted for
$\delta T_{c}$ or δl pinning are not expected [
53]. It is, however, noteworthy that in YBCO+Y211B film, the
n value is much higher than the rest of the samples and is close to 2.5, indicating that the contribution due to point pinning centers is substantial in this film. This observation seems rational as the high in-field
$J_c$ in YBCO+Y211 film at lower temperatures requires these weak point pinning centers act efficiently.