During testing, approximately 50 mm long Cu tapes of the outermost two layers are removed from each end of HFRC-1/2 and CORC-1/2 specimens. The ends are soldered to connect with the current lead, which is made of stacked Bi2223 tapes. Voltage taps are soldered on the YBCO layer at both ends of each cable for the Ic test. This method is used for specimens containing only three YBCO tapes. However, for the multi-layered HFRC-3 and CORC-3 specimens, the wound tapes at both ends are treated as a staircase with a step length of 10 mm. Then the cable ends are inserted into copper terminals and filled with SnPb solder to reduce contact resistance.
Fig. 4(a-c) shows the E-I characteristics of the CORC-1 and HFRC-1 specimens with straight cable and different bending diameters (D) at 77 K and self-field.
Fig. 4(b) shows that a linear resistance appears before the main transition, which could be caused by a difference in the current sharing condition between the inner layer of YBCO tapes and the outer two layers of Cu tapes. However, it is not observed in the HFRC-3 specimen (as shown in
Fig. 6) with all five outer layers of YBCO tapes. The Ic is determined using a fitting equation [
17] and a criterion of 1 μV cm
−1.
Fig. 5 compares the critical currents of CORC-1 and HFRC-1 specimens at different bending diameters. The critical currents for straight HFRC and CORC cable specimens with three YBCO tapes in one layer are approximately 480 A. However, at the bending radius of 80 mm, the critical current degradations of CORC-1 specimens are about 55%, while the critical current of HFRC-1 specimens remains almost unchanged. The cables are tested in bending conditions. Thus, the variation in current carrying performance includes both reversible and irreversible degradations. For the multi-layer HFRC-3 and CORC-3 specimens, the measured critical currents per layer are similar to the conditions in a straight cable. The total currents of CORC-3 and HFRC-3 are about 2350 A and 2374 A, respectively. It shows that there is no observable degradation in the cable fabrication with multiple YBCO layers. Besides the Ic, the n-values of the specimens are determined at an electric field interval from 0.1 to 1 μV cm
−1, which mostly falls within a range of 20 to 45.