Atomic force microscopy in the characterization and clinical evaluation of neurological disorders: current and emerging technologies

David T. She, Mui Hoon Nai, Chwee Teck Lim

Med-X ›› 2024, Vol. 2 ›› Issue (1) : 8-8.

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Med-X ›› 2024, Vol. 2 ›› Issue (1) : 8-8. DOI: 10.1007/s44258-024-00022-6
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Atomic force microscopy in the characterization and clinical evaluation of neurological disorders: current and emerging technologies

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 2(1): 8-8 https://doi.org/10.1007/s44258-024-00022-6

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