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Design-for-Test Solutions for 3-D Integrated Circuits
SHAO-CHUN HUNG, PARTHO BHOUMIK, ARJUN CHAUDHURI, SANMITRA BANERJEE, KRISHNENDU CHAKRABARTY
Integrated Circuits and Systems . 2024, (
1
): 3 -17 . DOI: 10.23919/ICS.2024.3419629
